Measurements of electric potential in a laser diode by Kelvin Probe Force Microscopy

Kelvin probe force microscopy

M. Nonnenmacher, M. O’Boyle, H. K. Wickramasinghe · Applied Physics Letters · 1991 · 2.3K citations

Natural Sciences, Materials Engineering, Materials Science +17

High-resolution capacitance measurement and potentiometry by force microscopy

Yves Martin, David W. Abraham, H. K. Wickramasinghe · Applied Physics Letters · 1988 · 695 citations

Natural Sciences, Electrical Engineering, Materials Science +17

Contact electrification using force microscopy

B. D. Terris, J. E. Stern, D. Rugar et al. · Physical Review Letters · 1989 · 530 citations

Natural Sciences, Materials Science, Physics +17

Deposition and imaging of localized charge on insulator surfaces using a force microscope

J. E. Stern, B. D. Terris, H. J. Mamin et al. · Applied Physics Letters · 1988 · 426 citations

Natural Sciences, Materials Engineering, Materials Science +17

High resolution atomic force microscopy potentiometry

Jonathan Weaver, David W. Abraham · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1991 · 405 citations

Natural Sciences, Electrical Engineering, Materials Science +15