Concepedia

Interpretation of capacitance vs. voltage measurements of p-n junctions

W.E. Carter, H.K. Gummel, B.R. Chawla

Solid-State Electronics · 1972 · 22 citations · 2 references

Concepts

EngineeringElectrical EngineeringMaterials ScienceElectrochemistryElectronic MaterialsSemiconductor MaterialsCurrent-voltage CharacteristicsDevice CharacterizationElectric CircuitsElectrical CharacterizationP-n JunctionsSemiconductor InterfacesCapacitance-voltage CharacteristicsCapacitance-voltage CharacterizationCapacitance-voltage MeasurementsCapacitance-voltage RelationsJunction Capacitance

References

2

Impurity Distribution in Epitaxial Silicon Films

Candice Thomas, D. Kahng, R. C. Manz · Journal of The Electrochemical Society · 1962 · 134 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

On the Measurement of Impurity Atom Distributions by the Differential Capacitance Technique [Letter to the Editor]

David P. Kennedy, R. R. O’Brien · IBM Journal of Research and Development · 1969 · 110 citations

Engineering, Electrical Engineering, Materials Science +17