Applied Physics Letters · 1993 · 24 citations · 7 references
Excellent Selective ContactsEngineeringElectron-beam LithographyOptoelectronic DevicesSelective DopingSemiconductor NanostructuresBeam LithographyOptical PropertiesDoping ProfilesMolecular Beam EpitaxyEpitaxial GrowthCompound SemiconductorMaterials ScienceSemiconductor TechnologyElectrical EngineeringPhysicsCrystalline DefectsSitu Lateral StructuringSemiconductor Device FabricationMicroelectronicsApplied PhysicsOptoelectronics
We present a novel molecular beam epitaxial regrowth technique which provides a simple and convenient way for the in situ lateral structuring of the doping profiles and growth rates on a μm scale. We achieve excellent selective contacts to the respective doping layers for device dimensions varying from several 100 μm down to several μm. Keldysh based n-i-p-i modulator structures, fabricated with our new method, exhibit an on/off ratio of 6:1 for a voltage swing of 7 V without enhancement by additional Bragg mirrors.
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G. H. Döhler, G. Hasnain, J. N. Miller · Applied Physics Letters · 1986 · 61 citations
Engineering, Crystal Growth Technology, Interdigital Grown-in Contacts +16