Ballistic-electron emission microscopy study of the Au/Si(111)7×7 and Au/CaF2/Si(111)7×7 interfaces

M. Teresa Cuberes, Andreas Bauer, H. J. Wen, M. Prietsch, G. Kaindl

Applied Physics Letters · 1994 · 21 citations · 17 references

Concepts

Abstract

Ballistic-electron emission microscopy (BEEM) has been performed on Au/n-Si(111)7×7 and Au/CaF2/n-Si(111)7×7 in UHV. In both cases, the topography of the Au surface is characterized by ≊2.5 Å height terraces, stacked in several stages, with rounded shapes for Au/Si, and hexagonal shapes for Au/CaF2/Si. BEEM up to tip voltages of 8 V on Au/Si is not altering the ballistic transmissivity, in contrast to previous work on Au/Si interfaces which involved chemical preparations of the Si surfaces. The shape of the BEEM spectra on Au/CaF2/Si depends on spectral features of the density of states of the CaF2 thin film.

References

17