H. J. Wen

Statistics

Publications

Citations

207

H-Index

Active since

1994

Affiliations

IBM Research - Thomas J. Watson Research Center(Current)

Freie Universität Berlin

H. J. Wen is an author at IBM Research - Thomas J. Watson Research Center specializing in materials science, semiconductor physics, and semiconductor materials.

ORCID

Publications per year

1994–2025

Publications

Ballistic-electron emission microscopy on the Au/<i>n</i>-Si(111)7×7 interface

M. Teresa Cuberes, A. Bauer, H. J. Wen et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1994 · 33 citations

Natural Sciences, Materials Science, Physics +17

Stressing and high field transport studies on device-grade SiO2 by ballistic electron emission spectroscopy

R. Ludeke, H. J. Wen, E. Cartier · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1996 · 32 citations

Engineering, Electrical Engineering, Materials Science +17

Investigation of existing defects and defect generation in device-grade SiO2 by ballistic electron emission spectroscopy

H. J. Wen, R. Ludeke · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1997 · 25 citations

Engineering, Electrical Engineering, Materials Science +17

Localized degradation studies of ultrathin gate oxides

H. J. Wen, R. Ludeke · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1998 · 22 citations

Engineering, Electrical Engineering, Materials Science +17

Ballistic-electron emission microscopy study of the Au/Si(111)7×7 and Au/CaF2/Si(111)7×7 interfaces

M. Teresa Cuberes, Andreas Bauer, H. J. Wen et al. · Applied Physics Letters · 1994 · 21 citations

Natural Sciences, Materials Science, Physics +17

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