Force Modulation Atomic Force Microscopy as a Powerful Tool in Organic-Inorganic Hybrid Materials Analysis

Giovanni Schiavon, Josef G. Kuchler, Benedetto Corain, Wolfgang Hiller

Advanced Materials · 2001 · 11 citations · 0 references

Concepts

Abstract

A combination of force modulation and atomic force microscopyhas been successfully applied to the structure analysis of hybrid materials for the first time (a typical image is shown in the Figure). This method allows the investigation of phase separation and surface distribution properties of organic–inorganic hybrid materials as a function of their composition.