Materials Science and Engineering B · 2000 · 10 citations · 12 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsDopingOxygen EffectSemiconductor Device MaterialsSilicon MaterialsDoped SemiconductorsOxygen Vacancy ChemistryOxygen Vacancy Formation
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Defect energy levels in boron-doped silicon irradiated with 1-MeV electrons
P. M. Mooney, L. J. Cheng, M. Süli et al. · Physical review. B, Solid state · 1977 · 297 citations