Comparative study of ion implantation caused anomalous surface damage in silicon studied by spectroscopic ellipsometry and Rutherford backscattering spectrometry

T. Lohner, M. Fried, N.Q. Khánh, P. Petrík, Herbert Wormeester, M. A. El-Sherbiny

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1999 · 22 citations · 17 references

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