IEEE Electron Device Letters · 1990 · 48 citations · 7 references
Photo Multiplication MeasurementsEngineeringNuclear PhysicsIon Beam InstrumentationIon ProcessIon ImplantationElectron SpectroscopyIon BeamIon EmissionElectrical EngineeringPhysicsMonte-carlo ModellingAtomic PhysicsPhotoelectric MeasurementElectric Field RangeNatural SciencesApplied PhysicsImpact Ionization RatesChemical Kinetics
Impact ionization rates for electrons and holes in (100) A1 <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">0.48</sub> In <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">0.52</sub> As were determined from photo multiplication measurements using AIInAs / FaInAs <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">p +-i-n</sup> diodes grown by metal-organic vapor phase epitaxy (MOVPE). The impact ionization rate ratio (prop; / beta;) was derived as being 2.0 ~ 3.5 over the electric field range from 400 to 650 KV / cm. Ionization rates were found to be smaller than those previously reported.
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R. People, K. W. Wecht, K. Alavi et al. · Applied Physics Letters · 1983 · 240 citations
Temperature dependence of impact ionization coefficients in InP
K. Taguchi, T. Torikai, Yoshimasa Sugimoto et al. · Journal of Applied Physics · 1986 · 58 citations