Superlattices and Microstructures · 2005 · 10 citations · 12 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsDevice CharacterizationDevice ModelingMetal-semiconductor ContactsOxide SemiconductorsSemiconductor Device MaterialsSemiconductor InterfacesCapacitanceJunction CapacitanceSchottky Barrier DiodesSchottky BarriersSchottky Contacts
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Hydrogen as a Cause of Doping in Zinc Oxide
Chris G. Van de Walle · Physical Review Letters · 2000 · 2.2K citations · Full text
Electrical characterization of 1.8 MeV proton-bombarded ZnO
F.D. Auret, S. A. Goodman, M. Hayes et al. · Applied Physics Letters · 2001 · 297 citations