Journal of Electronic Materials · 2000 · 12 citations · 3 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsInorganic ChemistrySemiconductor MaterialsDopingMetal-semiconductor ContactsSemiconductor Device MaterialsSemiconductor InterfacesSemiconductor SurfacesDoping InhomogeneityDoping UniformityPassivation MechanismsZinc Oxides
3
Optical techniques for composition measurement of bulk and thin-film Cd1−<i>y</i>Zn<i>y</i>Te
S. M. Johnson, S. Sen, W. H. Konkel et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1991 · 74 citations
Natural Sciences, Materials Engineering, Materials Science +17
Zn concentration determination in CdZnTe by NIR spectroscopy
C. D. Maxey, J. E. Gower, P. Capper et al. · Journal of Crystal Growth · 1999 · 25 citations