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Atomic Resolution with Atomic Force Microscope

546

Citations

19

References

1987

Year

Abstract

The atomic force microscope (AFM) is a promising new method for studying the surface structure of both conductors and insulators. In mapping a graphite surface with an insulating stylus, we have achieved a resolution better than 2.5 Å.

References

YearCitations

1986

14.3K

1982

2.9K

1986

485

1986

444

1985

297

1986

284

1986

271

1986

228

1986

197

1986

187

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