Europhysics Letters (EPL) · 1987 · 548 citations · 19 references
Natural SciencesMaterials SciencePhysicsAtomic PhysicsNanotechnologySurface ScienceAtomic Force MicroscopyAtomic StructureCrystallographyScanning Probe MicroscopySurface MicroscopyAtomic Force Microscopy Image ResolutionAtomic Force Microscopy Surface AnalysisAtomic ScatteringAtomic-resolution ImagingAtomic-scale Surface Imaging
The atomic force microscope (AFM) is a promising new method for studying the surface structure of both conductors and insulators. In mapping a graphite surface with an insulating stylus, we have achieved a resolution better than 2.5 Å.
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G. Binnig, C. F. Quate, Ch. Gerber · Physical Review Letters · 1986 · 14.4K citations · Full text
Silicon as a mechanical material
K. Petersen · Proceedings of the IEEE · 1982 · 2.9K citations
Atomic-Resolution Microscopy in Water
Richard Sonnenfeld, Paul K. Hansma · Science · 1986 · 485 citations