Publication | Closed Access
Atomic Resolution with Atomic Force Microscope
546
Citations
19
References
1987
Year
EngineeringMicroscopyAtomic ResolutionElectron MicroscopyAtomic Force MicroscopeNanometrologyMaterials SciencePhysicsNanotechnologyGraphite SurfaceNanomaterialsNatural SciencesSpectroscopySurface ScienceApplied PhysicsScanning Force MicroscopyScanning Probe MicroscopyGrapheneElectron MicroscopeInsulating Stylus
The atomic force microscope (AFM) is a promising new method for studying the surface structure of both conductors and insulators. In mapping a graphite surface with an insulating stylus, we have achieved a resolution better than 2.5 Å.
| Year | Citations | |
|---|---|---|
1986 | 14.3K | |
1982 | 2.9K | |
1986 | 485 | |
1986 | 444 | |
1985 | 297 | |
1986 | 284 | |
1986 | 271 | |
1986 | 228 | |
1986 | 197 | |
1986 | 187 |
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