Physical Review Letters · 1986 · 444 citations · 16 references
EngineeringMicroscopyTunneling MicroscopyElectron MicroscopyNew Stm ExperimentsGiant CorrugationsLateral ScaleMaterials SciencePhysicsNanotechnologyGraphite SurfaceMicroanalysisSolid MechanicsInteratomic ForcesScanning Probe MicroscopySurface ScienceApplied PhysicsCondensed Matter PhysicsScanning Force MicroscopyGrapheneElectron MicroscopeAtomic ForcesMechanics Of Materials
We show that scanning tunneling microscopy (STM) images can be dominated by elastic deformations induced by atomic forces between tip and surface. New STM experiments on graphite (0001) showing a strong variation of the giant corrugation amplitudes with varying current at constant voltage are direct evidence of this atomic-force concept. Corrugations up to 8 \AA{}A on a lateral scale of 2.4 \AA{} are associated with forces up to ${10}^{\ensuremath{-}8}$ N for compression and 2 \ifmmode\times\else\texttimes\fi{} ${10}^{\ensuremath{-}10}$ N for expansion.
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G. Binnig, C. F. Quate, Ch. Gerber · Physical Review Letters · 1986 · 14.3K citations · Full text
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