Analysis and modeling of a digital CMOS circuit operation and reliability after gate oxide breakdown: a case study - Concepedia

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Analysis and modeling of a digital CMOS circuit operation and reliability after gate oxide breakdown: a case study

44

Citations

31

References

2002

Year

Ben Kaczer, R. Degraeve, Mahmoud Rasras, A. De Keersgieter, K. Van de Mieroop, G. Groeseneken

Microelectronics Reliability

Electrical EngineeringReliability EngineeringEngineeringCircuit SystemHardware ReliabilityGate Oxide BreakdownComputer EngineeringCase StudyCircuit ReliabilityDevice ReliabilityMicroelectronics

References

	Year	Citations

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