Review of Scientific Instruments · 1998 · 78 citations · 17 references
Natural SciencesChemical EngineeringMaterials ScienceMicroelectromechanical SystemsMicrofabricationSurface ScienceAtomic Force MicroscopyMicrofluidicsScanning Probe MicroscopySurface MicroscopySurface PhysicsAtomic Force Microscopy Image ResolutionAtomic Force Microscopy Surface AnalysisContact Mode Atomic Force MicroscopyHydrothermal SynthesisMass Flow ControlMicroscope ImagingNoncontact Atomic Force MicroscopyThermocouple Instrumentation
We present the design of a contact atomic force microscope (AFM) that can be used to image solid surfaces in aqueous solution up to 150 °C and 6 atm. The main features of this unique AFM are: (1) an inert gas pressurized microscope base containing stepper motor for coarse advance and the piezoelectric tube scanner; (2) a chemically inert membrane separating these parts from the fluid cell; (3) a titanium fluid cell with fluid inlet–outlet ports, a thermocouple port, and a sapphire optical window; (4) a resistively heated ceramic booster heater for the fluid cell to maintain the temperature of solutions sourced from a hydrothermal bomb; and (5) mass flow control. The design overcomes current limitations on the temperature and pressure range accessible to AFM imaging in aqueous solutions. Images taken at temperature and pressure are presented, demonstrating the unit-cell scale (<1 nm) vertical resolution of the AFM under hydrothermal conditions.
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G. Binnig, C. F. Quate, Ch. Gerber · Physical Review Letters · 1986 · 14.4K citations · Full text
Surface Studies by Scanning Tunneling Microscopy
G. Binnig, H. Rohrer, Ch. Gerber et al. · Physical Review Letters · 1982 · 4.6K citations · Full text
7 × 7 Reconstruction on Si(111) Resolved in Real Space
G. Binnig, H. Rohrer, Ch. Gerber et al. · Physical Review Letters · 1983 · 1.9K citations · Full text
Tunneling through a controllable vacuum gap
G. Binnig, H. Rohrer, Ch. Gerber et al. · Applied Physics Letters · 1982 · 1.8K citations