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MBE Growth of HgCdTe on Large-Area Si and CdZnTe Wafers for SWIR, MWIR and LWIR Detection

DOI

19

Citations

12

References

2008

Year

M. Reddy, Jeffrey M. Peterson, D. D. Lofgreen, Jeff Franklin, T. Vang, E. P. G. Smith, J.G.A. Wehner, I. Kasai, J. W. Bangs, S. M. Johnson
Journal of Electronic Materials

References

YearCitations

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