Nonvolatile memory disturbs due to gate and junction leakage currents

Tunneling in a finite superlattice

Raphael Tsu, L. Esaki · Applied Physics Letters · 1973 · 2.3K citations

Quantum Science, Superconducting Material, Engineering +15

Carrier Generation and Recombination in P-N Junctions and P-N Junction Characteristics

Chih‐Tang Sah, Robert N. Noyce, W. Shockley · Proceedings of the IRE · 1957 · 2.1K citations

Device Modeling, Electrical Engineering, Carrier Generation +15

The science and engineering of microelectronic fabrication

Choice Reviews Online · 1996 · 648 citations

Engineering, Common Mems, Ion Implantation Systems +18

<i>Semiconductor Optoelectronic Devices</i>

P. Bhattacharya, Lily Pang · Physics Today · 1994 · 643 citations

Engineering, Semiconductors Optical Processes, Semiconductor Materials +18

Hydrogen Electrochemistry and Stress-Induced Leakage Current in Silica

Peter E. Blöchl, J. H. Stathis · Physical Review Letters · 1999 · 286 citations

Materials Science, Hydrogen-related Defects, Engineering +15