FTIR and XPS investigation of Er-doped SiO2–TiO2 films

Q. Fang, Mark S. Meier, Jinling Yu, Z.M. Wang, Jiafen Zhang, Jiang Wu, Anthony J. Kenyon, P. Hoffmann, Ian W. Boyd

Materials Science and Engineering B · 2003 · 77 citations · 30 references

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