Concepedia

Publication | Closed Access

A study of the linearity between Ion and logIoff of modern MOS transistors and its application to stress engineering

DOI

12

Citations

13

References

2007

Year

W.S. Lau, Peizhen Yang, C. W. Eng, V. Ho, C. H. Loh, S. Y. Siah, David Vigar, L. Chan
Microelectronics Reliability

References

YearCitations

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