David Vigar

Reliable Time Exponents for Long Term Prediction of Negative Bias Temperature Instability by Extrapolation

Rui Gao, Azrif Manut, Zhigang Ji et al. · IEEE Transactions on Electron Devices · 2017 · 40 citations · Full text

Engineering, Electrical Engineering, Electronic Materials +14

Insight Into Electron Traps and Their Energy Distribution Under Positive Bias Temperature Stress and Hot Carrier Aging

J. F. Zhang, Zhigang Ji, Weidong Zhang et al. · IEEE Transactions on Electron Devices · 2016 · 34 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +17

Hot carrier aging and its variation under use-bias: Kinetics, prediction, impact on Vdd and SRAM

Meng Duan, J. F. Zhang, Azrif Manut et al. · 2015 · 24 citations · Full text

Engineering, Computer Engineering, Aging +14

Stress migration reliability of wide CU interconnects with gouging vias

Yeow Kheng Lim, R. Arijit, K. L. Pey et al. · 2005 · 15 citations

Engineering, Electrical Engineering, Materials Engineering +17

Interaction between hot carrier aging and PBTI degradation in nMOSFETs: Characterization, modelling and lifetime prediction

Meng Duan, J. F. Zhang, J. C. Zhang et al. · 2017 · 15 citations · Full text

Engineering, Electrical Engineering, Materials Science +17