Publication | Closed Access
Direct Analysis of the Structure, Concentration, and Chemical Activity of Surface Atomic Vacancies by Specialized Low-Energy Ion-Scattering Spectroscopy: TiC(001)
111
Citations
10
References
1983
Year
EngineeringAtomic Emission SpectroscopyDirect AnalysisVacuum DeviceChemistryElectron SpectroscopyNanoelectronicsIon EmissionSurface Atomic VacanciesPhysicsPhysical ChemistryChemical ActivitySurface CharacterizationNatural SciencesSpectroscopySurface ScienceApplied PhysicsSurface AnalysisAtomic VacanciesHigh Activity
The structure, concentration, and chemical activity of atomic vacancies at the TiC(001) surface have been directly analyzed by specialized low-energy ion-scattering spectroscopy. It has been found that carbon vacancies are formed at the surface under a certain condition, and they capture oxygen atoms into the vacancy holes exhibiting a very high activity.
| Year | Citations | |
|---|---|---|
1981 | 282 | |
1976 | 212 | |
1982 | 186 | |
1979 | 117 | |
1979 | 100 | |
1981 | 95 | |
1982 | 70 | |
1980 | 46 | |
1982 | 38 | |
1974 | 13 |
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