Physical Review Letters · 1983 · 111 citations · 10 references
EngineeringAtomic Emission SpectroscopyDirect AnalysisVacuum DeviceChemistryElectron SpectroscopyNanoelectronicsIon EmissionSurface Atomic VacanciesPhysicsPhysical ChemistryChemical ActivitySurface CharacterizationNatural SciencesSpectroscopySurface ScienceApplied PhysicsSurface AnalysisAtomic VacanciesHigh Activity
The structure, concentration, and chemical activity of atomic vacancies at the TiC(001) surface have been directly analyzed by specialized low-energy ion-scattering spectroscopy. It has been found that carbon vacancies are formed at the surface under a certain condition, and they capture oxygen atoms into the vacancy holes exhibiting a very high activity.
10
Masakazu Aono, C. Oshima, Shigeaki Zaima et al. · Japanese Journal of Applied Physics · 1981 · 282 citations
Engineering, Electron Diffraction, Computational Chemistry +16
Surface analysis with low energy ion scattering
E. Taglauer, W. Heiland · Applied Physics A · 1976 · 212 citations
Low-Energy Ion Scattering from the Si(001) Surface
Masakazu Aono, Y. Hou, C. Oshima et al. · Physical Review Letters · 1982 · 186 citations
Materials Science, Surface Characterization, Engineering +12