Quantitative Surface Atomic Geometry and Two-Dimensional Surface Electron Distribution Analysis by a New Technique in Low-Energy Ion Scattering

Masakazu Aono, C. Oshima, Shigeaki Zaima, Shigeki Otani, Yoshio Ishizawa

Japanese Journal of Applied Physics · 1981 · 284 citations · 8 references

Concepts

Abstract

A new technique for analyzing the quantitative surface atomic geometry and the two-dimensional surface electron distribution is reported. The remarkable effectiveness of this new technique is demonstrated for TiC(111).

References

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