Shigeaki Zaima

High resolution-high energy x-ray photoelectron spectroscopy using third-generation synchrotron radiation source, and its application to Si-high k insulator systems

Keisuke Kobayashi, Makina Yabashi, Y. Takata et al. · Applied Physics Letters · 2003 · 353 citations

X-ray Spectroscopy, Engineering, Optoelectronic Devices +16

Quantitative Surface Atomic Geometry and Two-Dimensional Surface Electron Distribution Analysis by a New Technique in Low-Energy Ion Scattering

Masakazu Aono, C. Oshima, Shigeaki Zaima et al. · Japanese Journal of Applied Physics · 1981 · 282 citations

Engineering, Electron Diffraction, Computational Chemistry +16

Atomic chemical composition and reactivity of the TiC(111) surface

Shigeaki Zaima, Yukio Shibata, Hiroaki Adachi et al. · Surface Science · 1985 · 127 citations

Materials Science, Engineering, Surface Chemistry +5

Growth of highly strain-relaxed Ge1−xSnx/virtual Ge by a Sn precipitation controlled compositionally step-graded method

Shotaro Takeuchi, Yosuke Shimura, Osamu Nakatsuka et al. · Applied Physics Letters · 2008 · 121 citations

Materials Science, Materials Engineering, Epitaxial Growth +13

Characterization of GeSn materials for future Ge pMOSFETs source/drain stressors

Benjamin Vincent, Yosuke Shimura, Shotaro Takeuchi et al. · Microelectronic Engineering · 2010 · 105 citations

Materials Science, Electrical Engineering, Engineering +7