High-purity semi-insulating 4H-SiC grown by the seeded-sublimation method

Flash Method of Determining Thermal Diffusivity, Heat Capacity, and Thermal Conductivity

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Thin film deposition and microelectronic and optoelectronic device fabrication and characterization in monocrystalline alpha and beta silicon carbide

R. F. Davis, G. Kelner, M. S. Shur et al. · Proceedings of the IEEE · 1991 · 407 citations

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Finite pulse-time and heat-loss effects in pulse thermal diffusivity measurements

Richard C. Heckman · Journal of Applied Physics · 1973 · 160 citations

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The status of SiC bulk growth from an industrial point of view

St.G. Müller, R Glass, H. McD. Hobgood et al. · Journal of Crystal Growth · 2000 · 121 citations

Engineering, Materials Engineering, Materials Science +14

Contactless evaluation of semi-insulating GaAs wafer resistivity using the time-dependent charge measurement

R. Stibal, J. Windscheif, W. Jantz · Semiconductor Science and Technology · 1991 · 111 citations

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