Dependence of MOS transistor threshold voltage on substrate resistivity

Work Function, Photoelectric Threshold, and Surface States of Atomically Clean Silicon

F. G. Allen, G. W. Gobeli · Physical Review · 1962 · 467 citations

Natural Sciences, Materials Engineering, Materials Science +17

Investigation of thermally oxidised silicon surfaces using metal-oxide-semiconductor structures

Andrew S. Grove, B. E. Deal, E. H. Snow et al. · Solid-State Electronics · 1965 · 416 citations

Engineering, Materials Engineering, Materials Science +14

Characteristics of the metal-Oxide-semiconductor transistors

C. T. Sah · IEEE Transactions on Electron Devices · 1964 · 279 citations

Engineering, Electrical Engineering, Materials Science +16

The effects of fixed bulk charge on the characteristics of metal-oxide-semiconductor transistors

C. T. Sah, H.C. Pao · IEEE Transactions on Electron Devices · 1966 · 138 citations

Engineering, Electrical Engineering, Materials Science +17

Field effect studies of the oxidized silicon surface

J. Lindmayer · Solid-State Electronics · 1966 · 28 citations

Engineering, Materials Engineering, Materials Science +14