Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2001 · 24 citations · 10 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor MaterialsThin FilmsEpitaxial GrowthSemiconductor Device MaterialsSemiconductor PhysicsSemiconductor SurfacesSemiconductor Thin FilmsThin-film MaterialsAtomic Force Microscopy AnalysisAtomic Force Microscopy Surface AnalysisEpitaxial Film GrowthEpitaxial Thin FilmsEpitaxial Thin-film GrowthPulsed Laser DepositionSemiconductor Oxide Thin FilmsThin Oxide Films
Rutile-phase TiO2 thin films have been epitaxially grown on GaAs(100) substrates at 700 °C under 5 Pa oxygen ambient pressure, and at room temperature (30 °C) and 5×10−4 Pa base vacuum by KrF pulsed excimer laser deposition. The [110]-oriented TiO2 films were composed of two types of domains perpendicular to each other in the plane. From atomic force microscopy analysis, the epitaxial films had a surface with roughness less than 7 nm in root-mean-square.
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Characterization of optical thin films
H.K. Pulker · Applied Optics · 1979 · 283 citations
Natural Sciences, Materials Engineering, Materials Science +17
Samuel Chen, M. G. Mason, Henry J. Gysling et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1993 · 147 citations
Natural Sciences, Materials Engineering, Materials Science +17