Characterization of optical thin films

H.K. Pulker

Applied Optics · 1979 · 283 citations · 47 references

Concepts

Abstract

Various properties of dielectric thin films are discussed in this paper: refractive index and absorption coefficient, light scattering, structure, microstructure, density, gas sorption, chemical composition, homogeneity, adhesion, hardness and mechanical stress, and environmental influences.

References

47