Publication | Closed Access
Characterization of optical thin films
282
Citations
47
References
1979
Year
Optical MaterialsDielectricsEngineeringThin Film Process TechnologyOptical CharacterizationPhysical PropertyOptical PropertiesPulsed Laser DepositionThin Film ProcessingAbsorption CoefficientMaterials ScienceMaterials EngineeringOptical Thin FilmsElectrical PropertyRefractive IndexMaterial AnalysisApplied PhysicsDielectric Thin FilmsThin FilmsOptoelectronicsElectrical Insulation
Various properties of dielectric thin films are discussed in this paper: refractive index and absorption coefficient, light scattering, structure, microstructure, density, gas sorption, chemical composition, homogeneity, adhesion, hardness and mechanical stress, and environmental influences.
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