Influence of substrate on structural properties of TiO2 thin films obtained via MOCVD

X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials.

A. L. Patterson · Journal of the American Chemical Society · 1955 · 2.8K citations

Natural Sciences, Chemistry, Materials Science +11

Characterization of optical thin films

H.K. Pulker · Applied Optics · 1979 · 283 citations

Natural Sciences, Materials Engineering, Materials Science +17

Gallium oxide thin films: A new material for high-temperature oxygen sensors

Maximilian Fleischer, H. Meixner · Sensors and Actuators B Chemical · 1991 · 195 citations

Natural Sciences, Materials Engineering, Materials Science +15

A simple chemical vapour deposition method for depositing thin TiO2 films

K.S. Yeung, Yun Wah Lam · Thin Solid Films · 1983 · 191 citations

Natural Sciences, Materials Engineering, Materials Science +14

Electronic Properties of the Interface between Si and TiO₂ Deposited at Very Low Temperatures

Takashi Fuyuki, Hiroyuki Matsunami · Japanese Journal of Applied Physics · 1986 · 190 citations

Natural Sciences, Materials Engineering, Materials Science +17