Niobium nitride Josephson tunnel junctions with oxidized amorphous silicon barriers

Fujitoshi Shinoki, A. Shoji, S. Kosaka, S. Takada, Hisao Hayakawa

Applied Physics Letters · 1981 · 44 citations · 6 references

Concepts

Abstract

High-quality NbN/NbN Josephson tunnel junctions have been fabricated by rf sputtering. Tunneling barriers are formed by oxidizing amorphous silicon films produced with rf glow discharge deposition. For patterning the base and counter electrode, sputtered ZnO films are employed as a resist mask. The juncitons are found to have large gaps (2ΔNbN) =4.4 mV), to have low leakage current, and to be quite stable for storage and thermal cyclings.

References

6