Grain boundary and vacancy diffusion model for electromigration-induced damage in thin film conductors

Electromigration—A brief survey and some recent results

J. R. Black · IEEE Transactions on Electron Devices · 1969 · 1.5K citations

Engineering, Electrical Engineering, Materials Science +17

Stress generation by electromigration

I. A. Blech, Conyers Herring · Applied Physics Letters · 1976 · 515 citations

Natural Sciences, Electrical Engineering, Materials Science +16

Electromigration Damage in Aluminum Film Conductors

M. J. Attardo, R. Rosenberg · Journal of Applied Physics · 1970 · 264 citations

Natural Sciences, Materials Engineering, Materials Science +16

Void Formation and Growth During Electromigration in Thin Films

R. Rosenberg, Milton Ohring · Journal of Applied Physics · 1971 · 195 citations

Natural Sciences, Materials Engineering, Materials Science +13

Electromigration in Thin Al Films

I. A. Blech, Eugene S. Meieran · Journal of Applied Physics · 1969 · 188 citations

Natural Sciences, Materials Engineering, Materials Science +12