Depth profiles of sodium and calcium in glasses: A comparison of secondary ion mass analysis and Auger spectrometry

Abstract

Depth profiles of sodium and calcium in soda-lime glasses have been measured by both Auger electron spectrometry and secondary ion mass spectrometry. Profiles by the two techniques agree closely and can be influenced by experimental conditions. In particular, radiation heating from a charge neutralization filament in the SIMS system is shown to alter the sodium depth profile in specimens which have a surface depletion of sodium.