Composition-depth Profiles

Composition-Depth Profiles is a measurement construct that characterizes the spatial distribution of chemical elements as a function of depth within a diffusion coating, typically obtained through analytical techniques such as electron probe microanalysis or secondary ion mass spectrometry.

766

Publications

30.9K

Citations

2.8K

Authors

852

Institutions

Publications per year

2017–2026

74

Authors

2.8K

  1. SH
    S. Hofmann

    Max Planck Society, Germany

    16 publications · 692 citations

    14

    h-index

  2. MP
    M. P. Seah

    National Physical Laboratory, United Kingdom

    14 publications · 761 citations

    13

    h-index

  3. TT
    Tien T. Tsong

    Pennsylvania State University, United States

    11 publications · 559 citations

    10

    h-index

  4. IS
    Ian S. Gilmore

    National Physical Laboratory, United Kingdom

    10 publications · 569 citations

    10

    h-index

  5. GG
    Gunther G. Andersson

    Flinders University, Australia

    10 publications · 334 citations

    10

    h-index

1–5 of 2.8K

Venues

  1. Surface and Interface Analysis

    SIA · 72 publications · 2.4K citations

    27

    h-index

  2. Journal of Applied Physics

    46 publications · 2K citations

    25

    h-index

  3. Applied Physics Letters

    42 publications · 1.7K citations

    24

    h-index

  4. 17

    h-index

  5. Journal of Vacuum Science and Technology

    18 publications · 804 citations

    15

    h-index

1–5