Olof C. Hellman

Analysis of Three-dimensional Atom-probe Data by the Proximity Histogram

Olof C. Hellman, Justin A. Vandenbroucke, Järg Rüsing et al. · Microscopy and Microanalysis · 2000 · 795 citations

Efficient sampling for three-dimensional atom probe microscopy data

Olof C. Hellman, John Blatz du Rivage, David N. Seidman · Ultramicroscopy · 2003 · 165 citations

Engineering, Physics, Microscopy +7

Measurement of the Gibbsian interfacial excess of solute at an interface of arbitrary geometry using three-dimensional atom probe microscopy

Olof C. Hellman, David N. Seidman · Materials Science and Engineering A · 2002 · 107 citations

Engineering, Physics, Microscopy +9

Application software for data analysis for three-dimensional atom probe microscopy

Olof C. Hellman, J. Vandenbroucke, John Blatz du Rivage et al. · Materials Science and Engineering A · 2002 · 72 citations

Electron Microscopy, Physics, Microscopy +11

Heteroepitaxy and characterization of CuInSe2 on GaAs(001)

Shigeru Niki, Y. Makita, A. Yamada et al. · Journal of Crystal Growth · 1995 · 58 citations

Engineering, Applied Physics, Quantum Materials +2