On the mechanism of silver and copper sulfidation by atmospheric H2S and OCS

T. E. Graedel, J. P. Franey, G. J. Gualtieri, +2

Corrosion Science

Chemical EngineeringEngineeringCopper SulfidationChemical FormAir Quality +5

Analysis of the Air‐Formed Oxide Film on a Series of Iron‐Chromium Alloys by Ion‐Scattering Spectrometry

R. P. Frankenthal, D. L. Malm

Journal of The Electrochemical Society

Materials ScienceSurface CharacterizationSurface PreparationEngineeringOxidation Resistance +10

Investigation of carbon incorporation in GaAs using13C-enriched trimethylarsenic and13Ch4

R. M. Lum, J. K. Klingert, D. W. Kisker, +5

Journal of Electronic Materials

Materials EngineeringSemiconductorsEngineeringApplied PhysicsCarbon Incorporation +1

Semiconductor interface characterization in photoelectrochemical solar cells: the p-indium phosphide (111)A face

H. J. Lewerenz, D. E. Aspnes, B. Miller, +2

Journal of the American Chemical Society

EngineeringOrganic Solar CellAltmetric Attention ScorePhoto-electrochemical CellPhotovoltaic Devices +19

Atomic layer epitaxy of GaAs by chemical beam epitaxy

T. H. Chiu, J. E. Cunningham, A. Robertson, +1

Journal of Crystal Growth

Electrical EngineeringEngineeringAtomic Layer EpitaxyApplied PhysicsMolecular Beam Epitaxy +2

Depth profiles of sodium and calcium in glasses: A comparison of secondary ion mass analysis and Auger spectrometry

D. L. Malm, M. J. Vasile, F. J. Padden, +2

Journal of Vacuum Science and Technology

Materials ScienceGlass-ceramicEngineeringGlass-forming LiquidCharge Neutralization Filament +11

Heterointerface stability in GaAs-on-Si grown by metalorganic chemical vapor deposition

S. J. Pearton, D. L. Malm, L. A. Heimbrook, +5

Applied Physics Letters

EngineeringSemiconductor MaterialsSi DiffusionOptoelectronic DevicesIntegrated Circuits +15

Spark source mass spectrometric measurements of dopants of known concentrations in gallium phosphide

A. J. Ahearn, F. A. Trumbore, C. J. Frosch, +2

Analytical Chemistry

Atomic Emission SpectroscopyBiological Mass SpectrometryAltmetric Attention ScoreChemistrySpectrochemical Analysis +16

A Study of Contamination on Electroplated Gold, Copper, Platinum, and Palladium

D. L. Malm, M. J. Vasile

Journal of The Electrochemical Society

Materials ScienceElectrometallurgyChemical EngineeringEngineeringCorrosion +11

Characterization of anodized aluminium—Copper vapour-deposited films by ion scattering spectrometry

Hans‐Henning Strehblow, D. L. Malm

Corrosion Science

Materials ScienceEngineeringVapour-deposited FilmsMaterials CharacterizationApplied Physics +6