Optimization-based multifrequency test generation for analog circuits

NLPQL: A fortran subroutine solving constrained nonlinear programming problems

Klaus Schittkowski · Annals of Operations Research · 1986 · 1.2K citations

Computing, Computer Science, Algorithms +6

NLPQL: A fortran subroutine solving constrained nonlinear programming problems

Klaus Schittkowski · Annals of Operations Research · 1986 · 749 citations

Computing, Computer Science, Algorithms +6

Detection of catastrophic faults in analog integrated circuits

Linda Milor, V. Visvanathan · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1989 · 241 citations

Engineering, Electrical Engineering, Analog Electronics +14

Minimizing production test time to detect faults in analog circuits

Linda Milor, Alberto Sangiovanni‐Vincentelli · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1994 · 180 citations

Engineering, Electrical Engineering, Analog Electronics +8

Fault-based automatic test generator for linear analog circuits

N. Nagi, Abhijit Chatterjee, A. Balivada et al. · International Conference on Computer Aided Design · 1993 · 90 citations

Engineering, Electrical Engineering, Analog Electronics +15