A current based self-test methodology for RF front-end circuits

Iddq testing for CMOS VLSI

R. Rajsuman · Proceedings of the IEEE · 2000 · 198 citations

Engineering, Computer Engineering, Electrical Engineering +13

A Signature Test Framework for Rapid Production Testing of RF Circuits

R. Voorakaranam, S. Cherubal, Abhijit Chatterjee · Design, Automation, and Test in Europe · 2002 · 90 citations

Engineering, Electrical Engineering, Microelectronics +16

A low-cost test solution for wireless phone RFICs

John Ferrario, Randy Wolf, Scott D. Moss et al. · IEEE Communications Magazine · 2003 · 78 citations

Engineering, Computer Engineering, Electrical Engineering +17

An architecture for self-test of a wireless communication system using sampled IQ modulation and boundary scan

M.S. Heutmaker, Duy Le · IEEE Communications Magazine · 1999 · 55 citations

Engineering, Communication, Electrical Engineering +17

Test generation with high coverages for quiescent current test of bridging faults in combinational circuits

E. Isern, Joan Figueras · 2002 · 51 citations

Engineering, Computer Engineering, Electrical Engineering +13