Applied Physics Letters · 2011 · 13 citations · 15 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsSemiconductor DevicesSemiconductor MaterialsNanoelectronicsNanostructured Electronic MaterialsNanowiresSemiconductor NanomaterialsSemiconductor PhysicsThermoelectric MaterialsCarrier GenerationConductivityDefect StatesDifferential ResistanceElectron Impact IonizationPhase-change MemorySemiconductor NanowiresThreshold Voltage
We report reversible switching between Ohmic and negative differential resistance states at a threshold voltage in sub-100-nm diameter sulfurized antimony selenide nanowires. We show that threshold switching in our nanowires arises due to high non-equilibrium free carrier concentrations resulting from impact ionization of carriers from defect states traceable to sulfurization and surface dangling bonds. Threshold switching is suppressed because of inhibited carrier generation at air-passivated defect states or at high temperatures due to thermally induced carrier depletion from deep states which preempts impact ionization. Such non-linear phenomena would be important for designing phase-change memories, thermoelectric devices, and sensors using pnictogen chalcogenide nanowires.
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Reproducible resistance switching in polycrystalline NiO films
Sunae Seo, Myoung‐Jae Lee, David H. Seo et al. · Applied Physics Letters · 2004 · 934 citations
Natural Sciences, Materials Engineering, Materials Science +16
Electronic Switching in Phase-Change Memories
A. Pirovano, Andrea L. Lacaita, A. Benvenuti et al. · IEEE Transactions on Electron Devices · 2004 · 612 citations
Threshold switching in chalcogenide-glass thin films
David Adler, M. S. Shur, M. Silver et al. · Journal of Applied Physics · 1980 · 493 citations
Natural Sciences, Materials Engineering, Materials Science +17