Small-angle subgrain boundaries emanating from dislocation pile-ups in multicrystalline silicon studied with synchrotron white-beam X-ray topography

Use of synchrotron radiation in X-ray diffraction topography

K. Naukkarinen, P. Rabe · physica status solidi (a) · 1974 · 238 citations

Engineering, Synchrotron Radiation Research, Physics +14

Recovery revisited

E. Nes · Acta Metallurgica et Materialia · 1995 · 228 citations

Subgrain growth in heavily deformed aluminium—experimental investigation and modelling treatment

Trond Furu, R. Ørsund, E. Nes · Acta Metallurgica et Materialia · 1995 · 115 citations

Materials Science, Engineering, Severe Plastic Deformation +6

Growth of dislocation clusters during directional solidification of multicrystalline silicon ingots

Birgit Ryningen, Gaute Stokkan, Maulid Kivambe et al. · Acta Materialia · 2011 · 110 citations

Materials Engineering, Materials Science, Engineering +12

Generation mechanism of dislocations during directional solidification of multicrystalline silicon using artificially designed seed

Isao Takahashi, Noritaka Usami, Kentaro Kutsukake et al. · Journal of Crystal Growth · 2010 · 100 citations

Engineering, Severe Plastic Deformation, Mechanical Engineering +16