Synchrotron Microstructure Characterization
Synchrotron Microstructure Characterization is a microstructure analysis technique that utilizes high-brilliance synchrotron X-ray radiation to non-destructively probe the internal structure of materials at micrometer and sub-micrometer scales, enabling high-resolution, real-time, and phase-sensitive characterization of crystalline phases, defects, strain, and texture.
265
Publications
10.9K
Citations
1.3K
Authors
474
Institutions
Publications per year
2017–2026
73
Parents
265
1–5 of 265
1.3K
10
h-index
9
h-index
7
h-index
6
h-index
6
h-index
1–5 of 1.3K
474

Centre National de la Recherche Scientifique
Paris, France
23 h-index
105 publications
9.2K citations

European Synchrotron Radiation Facility
Grenoble, France
22 h-index
70 publications
6.2K citations
Argonne National Laboratory
Lemont, United States
22 h-index
68 publications
2.4K citations

University of Manchester
Manchester, United Kingdom
12 h-index
36 publications
2.1K citations

Lawrence Berkeley National Laboratory
Berkeley, United States
11 h-index
26 publications
1.4K citations
Japan Synchrotron Radiation Research Institute
Sayō, Japan
11 h-index
20 publications
547 citations

Diamond Light Source
Didcot, United Kingdom
9 h-index
15 publications
971 citations

Brookhaven National Laboratory
Upton, United States
9 h-index
17 publications
552 citations
1–8 of 474
26 publications · 2.2K citations
23
h-index
18 publications · 769 citations
14
h-index
13 publications · 424 citations
13
h-index
14 publications · 444 citations
13
h-index
10 publications · 266 citations
10
h-index
1–5