Synchrotron Microstructure Characterization

Synchrotron Microstructure Characterization is a microstructure analysis technique that utilizes high-brilliance synchrotron X-ray radiation to non-destructively probe the internal structure of materials at micrometer and sub-micrometer scales, enabling high-resolution, real-time, and phase-sensitive characterization of crystalline phases, defects, strain, and texture.

265

Publications

10.9K

Citations

1.3K

Authors

474

Institutions

Publications per year

2017–2026

73

Authors

1.3K

  1. NT
    Nobumichi Tamura

    Lawrence Berkeley National Laboratory, United States

    10 publications · 606 citations

    10

    h-index

  2. PC
    Peter Cloetens

    European Synchrotron Radiation Facility, France

    9 publications · 1.3K citations

    9

    h-index

  3. JB
    J. Baruchel

    European Synchrotron Radiation Facility, France

    7 publications · 469 citations

    7

    h-index

  4. KU
    Kentaro Uesugi

    Japan Synchrotron Radiation Research Institute, Japan

    6 publications · 151 citations

    6

    h-index

  5. JA
    Jonathan Almer

    Argonne National Laboratory, United States

    6 publications · 190 citations

    6

    h-index

1–5 of 1.3K

Venues

  1. Acta Materialia

    26 publications · 2.2K citations

    23

    h-index

  2. Scripta Materialia

    18 publications · 769 citations

    14

    h-index

  3. Materials Science and Engineering A

    13 publications · 424 citations

    13

    h-index

  4. 13

    h-index

  5. Journal of Synchrotron Radiation

    10 publications · 266 citations

    10

    h-index

1–5