Concepedia

Publication | Closed Access

Drop impact reliability of edge-bonded lead-free chip scale packages

DOI

13

Citations

24

References

2009

Year

Andrew Farris, Jianbiao Pan, Albert A. Liddicoat, Michael Krist, Nicholas Vickers, Brian J. Toleno, Dan Maslyk, Dongkai Shangguan, Jasbir Bath, Dennis Willie,
Microelectronics Reliability

References

YearCitations

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