Concepedia

Publication | Closed Access

Degradation of AlGaN/GaN HEMTs under elevated temperature lifetesting

DOI

83

Citations

10

References

2004

Year

Y.C. Chou, D. Leung, Ioulia Smorchkova, M. Wójtowicz, R. Grundbacher, L. Callejo, Qiang Kan, R. Lai, P.H Liu, D. Eng,
Microelectronics Reliability

References

YearCitations

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