Degradation of AlGaN/GaN HEMTs under elevated temperature lifetesting

Y.C. Chou, D. Leung, Ioulia Smorchkova, M. Wójtowicz, R. Grundbacher, L. Callejo, Qiang Kan, R. Lai, P.H Liu, D. Eng,

Microelectronics Reliability · 2004 · 86 citations · 10 references

Concepts

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