Reliability of DH GaAs lasers at elevated temperatures

Abstract

Data from accelerated aging tests on continuously operating stripe−geometry double−heterostructure GaAs lasers are presented. By extrapolating data obtained in dry−nitrogen ambients at temperatures of 90, 70, and 50 °C, it is concluded that continuous room−temperature operation of these devices as lasers with power outputs exceeding 1 mW per laser face for times in excess of 100000 h is possible.