Interlayer diffusion phenomena in Ti-Au metallizations on n-type GaAs at 250°–450°C

Metal-semiconductor contacts

M. Pepper · Physics in Technology · 1974 · 1.1K citations

Principles and applications of ion beam techniques for the analysis of solids and thin films

J. W. Mayer, M‐A. Nicolet, T.M. Buck et al. · Thin Solid Films · 1973 · 332 citations

Natural Sciences, Materials Science, Physics +12

LOW-TEMPERATURE MIGRATION OF SILICON IN THIN LAYERS OF GOLD AND PLATINUM

Akio Hiraki, M.−A. Nicolet, J. W. Mayer · Applied Physics Letters · 1971 · 194 citations · Full text

Natural Sciences, Chemistry, Materials Science +9

The equilibrium diagram of the system gold-gallium

Chr. Cooke, William Hume-Rothery · Journal of the Less Common Metals · 1966 · 110 citations

Natural Sciences, Materials Science, Physics +13

X-ray study of interdiffusion in bimetallic Cu–Au films

K. N. Tu, B. S. Berry · Journal of Applied Physics · 1972 · 102 citations

Natural Sciences, Materials Engineering, Materials Science +17