IEEE Journal of Solid-State Circuits · 1981 · 32 citations · 5 references
EngineeringComputer EngineeringElectrical EngineeringFault ToleranceMicroelectronicsSemiconductor DevicesCmos Circuit DesignDevice ModelingDevice ReliabilityDevice SimulationIntegrated Circuit DesignMemory Subsystem DesignAlpha Particle PhysicsCircuit SimulationMemory Circuit DesignRadiation-hardened Memory DevicesSense Amplifier DesignSingle Event Upset ModelingSoft Error ReliabilitySoft Errors
Sense-amplifier column and cell alpha particle hits have been simulated for a 64K MOS dynamic RAM using SPICE, a circuit simulation program. Simulations investigate the influence of circuit, timing, and layout on the possibility of alpha soft errors. The column to sense amplifier impedance is found to strongly influence the likelihood of soft errors. Results are useful for designing for alpha immunity.
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A fault-tolerant 64K dynamic random-access memory
R.P. Cenker, D.G. Clemons, W.R. Huber et al. · IEEE Transactions on Electron Devices · 1979 · 96 citations