Publication | Closed Access
Coverage properties of silicon nitride film prepared by the Cat-CVD method
24
Citations
12
References
2003
Year
Materials EngineeringMaterials ScienceEngineeringSilicon On InsulatorApplied PhysicsSilicon Nitride FilmSemiconductor Device FabricationChemical Vapor DepositionCoverage PropertiesThin Film ProcessingCat-cvd Method
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