Surface Science · 2007 · 42 citations · 9 references
Natural SciencesMaterials EngineeringMaterials ScienceNanotechnologyRadiation DetectionSpectroscopyX-ray Data AnalysisX-ray DetectionX-ray SpectroscopyLaboratory X-ray SpectroscopySynchrotron X-ray Spectroscopy
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SPELEEM: Combining LEEM and Spectroscopic Imaging
Thomas Schmidt, Stefan Heun, J. Slezák et al. · Surface Review and Letters · 1998 · 245 citations
Time-of-flight photoemission electron microscopy – a new way to chemical surface analysis
G. Schönhense, A. Oelsner, O. Schmidt et al. · Surface Science · 2001 · 42 citations
Natural Sciences, Chemistry, Physics +14