Thomas Schmidt - Concepedia

Author

Thomas Schmidt

Also Known As

Bergmann, J., Höger, I., Luxemburk, Jan, Schmidt, T., Schmidt, Th., Schmidt, Thomas, Schmidt, Thomas C., Schmidt, Thomas, C., T Schmidt, T. SCHMIDT

272

Publications

6.4K

Citations

H-Index

154

Concepts

All Affiliations

University of Würzburg Fritz Haber Institute of the Max Planck Society University of Bremen Elettra-Sincrotrone Trieste S.C.p.A.Leibniz University Hannover

About

Thomas Schmidt is an author at University of Würzburg specializing in engineering, applied physics, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	36	93	4.9K
2	Applied Physics	32	80	4.1K
3	Natural Sciences	16	23	1.3K
4	Health Sciences	4	4	132
5	Medicine	2	2	78

Thomas Schmidt

122

Publications

5.8K

Citations

H-Index

Page 1

	Year	Citations
Superradiance of quantum dots Michael Scheibner, Thomas Schmidt, L. Worschech, Nature Physics Quantum ScienceEngineeringQuantum ComputingPhysicsApplied Physics	2007	479
High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies Vladimir N. Strocov, Thorsten Schmitt, U. Flechsig, Journal of Synchrotron Radiation X-ray SpectroscopyEngineeringBeamline OpticsSynchrotron Radiation SourceBeam Optic	2010	373
The Materials Science beamline upgrade at the Swiss Light Source P. R. Willmott, D. Meister, Steven Leake, Journal of Synchrotron Radiation Materials EngineeringPhotonicsMaterials ScienceOptical MaterialsEngineering	2013	291
Chemical bonding of PTCDA on Ag surfaces and the formation of interface states Ying Zou, L. Kilian, Achim Schöll, Surface Science Materials ScienceSurface CharacterizationInterface ChemistryEngineeringSurface Chemistry	2006	270
SPELEEM: Combining LEEM and Spectroscopic Imaging Thomas Schmidt, Stefan Heun, J. Slezák, Surface Review and Letters EngineeringMicroscopyCombining LeemTrue Characteristic XpeemElectron Diffraction	1998	244
Spatiotemporal Stability of a Femtosecond Hard–X-Ray Undulator Source Studied by Control of Coherent Optical Phonons P. Beaud, Steven L. Johnson, A. Streun, Physical Review Letters Optical MaterialsX-ray SpectroscopyEngineeringSynchrotron Radiation SourceSpatiotemporal Stability	2007	186
Fluorination of copper phthalocyanines: Electronic structure and interface properties Heiko Peisert, M. Knupfer, T. Schwieger, Journal of Applied Physics Organic Charge-transfer CompoundInorganic ChemistryEngineeringPhotochemistryX-ray Photoemission Spectroscopy	2003	159
SMART: a planned ultrahigh-resolution spectromicroscope for BESSY II R. Fink, M. Weiss, E. Umbach, Journal of Electron Spectroscopy and Related Phenomena Analytical InstrumentationSpectroscopyBessy IiInstrumentationSpectroscopic Method	1997	154
Line shapes and satellites in high-resolution x-ray photoelectron spectra of large π-conjugated organic molecules Achim Schöll, Ying Zou, Min‐Cherl Jung, The Journal of Chemical Physics Organic Charge-transfer CompoundEngineeringPhotochemistryPi-conjugated Organic MoleculesSpectroscopy	2004	129
Activation of 1.54 μm Er<sup>3+</sup>Fluorescence in Concentrated II−VI Semiconductor Cluster Environments Thomas Schmidt, Gerd Müller, Lubomír Spanhel, Chemistry of Materials EngineeringColloidal NanocrystalsLower Phonon EnergyOptoelectronic DevicesChemistry	1998	125

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