N. Barrett

Calcification rate influence on trace element concentrations in aragonitic bivalve shells: Evidences and mechanisms

Matthieu Carré, Ilham Bentaleb, Olivier Bruguier et al. · Geochimica et Cosmochimica Acta · 2006 · 259 citations

Calcification Rate Influence, Engineering, Trace Element Geochemistry +9

HfO 2 / SiO 2 interface chemistry studied by synchrotron radiation x-ray photoelectron spectroscopy

O. Renault, D. Samour, J.-F. Damlencourt et al. · Applied Physics Letters · 2002 · 200 citations

Materials Science, Ii-vi Semiconductor, Sio2 Contributions +14

Physical chemistry of the TiN/Hf0.5Zr0.5O2 interface

Wassim Hamouda, A. Pancotti, C. Lubin et al. · Journal of Applied Physics · 2020 · 162 citations

Materials Science, Oxygen Vacancy, Non-volatile Memory +14

Chemistry and Atomic Distortion at the Surface of an Epitaxial BaTiO₃ Thin Film after Dissociative Adsorption of Water

J. L. Wang, F. Gaillard, A. Pancotti et al. · The Journal of Physical Chemistry C · 2012 · 76 citations

Engineering, Dissociative Adsorption, Thin Film Process Technology +20

Unraveling the conduction mechanism of Al-doped ZnO films by valence band soft x-ray photoemission spectroscopy

M. Gabás, S. Gota, J.R. Ramos-Barrado et al. · Applied Physics Letters · 2005 · 74 citations

Aluminium Nitride, Engineering, Band Conduction Mechanism +16