Microelectronics Journal · 2003 · 27 citations · 3 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsMicrofabricationSemiconductor DevicesAtomic Force MicroscopyEtching ProcessesMicrofabrication MaterialsSilicon MaterialsSurface ModificationSurface RoughnessAtomic Force Microscopy AnalysisChemical EtchingField EmissionSilicon EtchingSingle-crystal SiliconSurface EtchingWet Chemical EtchingWet Etching
3
Integrated electrostatically resonant scan tip for an atomic force microscope
Lingjiang Kong, B. G. Orr, K.D. Wise · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1993 · 22 citations
Engineering, Bioengineering, Microelectromechanical Systems +14