Publication | Closed Access
A neural approach to study the scaling capability of the undoped Double-Gate and cylindrical Gate All Around MOSFETs
35
Citations
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References
2007
Year
Device ModelingElectrical EngineeringScaling CapabilityEngineeringTechnology ScalingComputational NeuroscienceComputer EngineeringNeural ApproachUndoped Double-gateMicroelectronics
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